Nanoscale Characterization

This course introduces students to theories and practices of the characterization techniques and instruments commonly used in nanoscale research and manufacturing. The topics include piezoelectric effect, nano-positioning, Vander Waals force, Atomic Force Microscope (AFM), Secondary Electrons and Environmental Scanning Electron Microscope (ESEM), Bremsstrahlung and Energy-Dispersive X-ray Spectroscope (EDX), Fluorescence and Confocal Microscope, and Polarization and Ellipsometery. Principles of other characterization methods, such as Scanning Tunneling Microscopy (STM) and Nuclear Magnetic Resonance Spectroscopy, will also be introduced. The course is designed to be hybrid, with approximately 50% lecture and 50% lab.